*2.3.2 Scanning electron microscopy*

Scanning electron microscope (SEM) equipped with energy dispersive spectroscopy (EDS) Backscattered electron (BSE) detector coupled with the EDS allows for composition identification of materials. Scanning Electron Microscopy Model: JEOL JSM–638OLA from JEOL, USA, operated at 30 kV; Magnification range-3,00,000×, which allows studying the microstructures and surface morphologies.
