*2.3.3 X-Ray diffraction*

X-ray diffraction (XRD) is one of the primary techniques used for the characterization of crystalline solids and determination of their structure or phases. XRD measurements are carried out in M/s Proto Manufacturing Ltd., CANADA make PROTO–iXRD MGR40, wherein the analysis was carried out 2θ: an angular range of 20° to 90° at a scanning speed of 20 /min. The XRD patterns obtained were analyzed with the help of PCPDFWIN software to identify the formation of primary, secondary and ternary phases.

### **2.4 Mechanical testing**
