**4. Conclusion**

In this study, we developed porous silicon layers by electrochemical anodization, the optical characterization made by spectroscopic ellipsometry (SE), and photoluminescence (PL); this characterization enabled us to calculate the physical and optical parameters (porosity, thickness; refractive index, extinction coefficient). To determine the effect of the etching parameters, we have suggested that for a good elaboration of the porous layers, it would be necessary to know the optimal conditions of anodization, taking into account the great role of the oxide layer on the surface. We note that the results obtained demonstrate that it excites a correlation between photoluminescence characterization (PL) and measurement of spectroscopic ellipsometry (SE), and these results are very important in the photovoltaic field.

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**Author details**

Rahmouni Salah1,2

Skikda, Algeria

*Optical Study of Porous Silicon Layers Produced Electrochemically for Photovoltaic Application*

1 Higher School for Professor of Technological Education, ENSET, Skikda, Algeria

2 Laboratory of Physical Chemistry and Biology of Materials (LPCBM), ENSET,

© 2020 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/ by/3.0), which permits unrestricted use, distribution, and reproduction in any medium,

\*Address all correspondence to: rahmouni.eln@gmail.com

provided the original work is properly cited.

*DOI: http://dx.doi.org/10.5772/intechopen.93720*

*Optical Study of Porous Silicon Layers Produced Electrochemically for Photovoltaic Application DOI: http://dx.doi.org/10.5772/intechopen.93720*
