**2.2 Instruments**

FEI's scanning electronic microscope (SEM) was used with tungsten filament at 25 kV. A Perkin Elmer's FT-IR Spectrum100 spectrometer was used where the scanning range was from 4000 cm−1 to 400 cm−1. X-ray diffraction (XRD) was measured using a Siemens D-500 apparatus. The thermal analyses were carried out with Perkin Elmer analyst Pyris Diamant S II. Dynamic light scattering (DLS) was performed at Malvern's Zetasizer Nano and each measurement represents the average of three measurements. A Sorvall Evolution RC centrifuge was used for container separation. An Elma Sonic ultrasonic bath, S 30H, was used to disperse the samples. The sterilizations were carried out with steam sterilizer of Trade Raypa. Any utensils and solutions to be used for the development of microorganisms were sterilized at 120°C for 20 min.
