**Acknowledgements**

We would like to thank Tenaris Confab and Petrobras for the material donation, Brazilian Nanotechnology National Laboratory (LNNano) for the provision of the FEI ® Quanta 650FEG SEM/EBSD microscope, and X-ray Diffractometer. Special thanks are due to Pedro Brito and Eduardo Fonseca for their important review and suggestions of the manuscript. Vanessa da Silva from LNNano and Alberto Cury from USP/EESC are acknowledged for XRD measurements. This study was financed in part by the National Council for Scientific and Technological Development, Brazil CNPq, process 150215/2016-9; also H. Pinto is a CNPq fellow.

*Strength of Materials*
