Author details

Hiroaki Matsui Department of Bioengineering, Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan

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\*Address all correspondence to: hiroaki@ee.t.u-tokyo.ac.jp

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Surface Plasmons in Oxide Semiconductor Nanoparticles: Effect of Size and Carrier Density DOI: http://dx.doi.org/10.5772/intechopen.86999
