*CO2 Reduction Characteristics of Cu/TiO2 with Various Reductants DOI: http://dx.doi.org/10.5772/intechopen.93105*

The electron probe emits the electrons to the sample under the acceleration voltage of 15 kV and the current of 3.0 <sup>10</sup><sup>8</sup> A, when the surface structure of sample is analyzed by SEM. The characteristic X-ray is detected by EPMA at the same time, resulting that the concentration of channel element is analyzed according to the relationship between the characteristic X-ray energy and the atomic number. The spatial resolutions of SEM and EPMA are 10 μm. The EPMA analysis helps not only to understand the coating state of prepared photocatalyst but also to measure the amount of doped metal within TiO2 film on the base material.

The electron probe emits the electron to the sample under the acceleration voltage of 200 kV, when the inner structure of sample is analyzed by TEM. The size, thickness, and structure of loaded Cu were evaluated. The characteristic X-ray is detected by EDX at the same time, resulting that the concentration distribution of chemical element toward thickness direction of the sample is analyzed. In the present study, the concentration distribution of Ti and Cu were analyzed.

EELS can be applied not only for element detection but also determination of oxidization states of some transition metals. The EELS characterization was performed by JEM-ARM200F equipped with GIF Quantum having 2048 ch. The dispersion of 0.5 eV/ch can be achieved for the full width at half maximum of the zero loss peak.
