*Polyimide Films for Digital Isolators DOI: http://dx.doi.org/10.5772/intechopen.93343*

20% voltage derating). Based on wafer-level analysis comparison, it is reasonable to attribute the lifetime and working voltage improvements to the SiN injection barriers between polyimide and metallic coils. These SiN thin layers, by mitigating bipolar charge injection at the onset of space charge formation, reduce the electrical current, the related thermal effects, and, very likely, extend the lifetime for a given voltage.
