**3.3 Compositional analysis of Ce75Al25 − xGax alloys through energy-dispersive X-ray analysis**

The EDX spectra of Ce75Al25 − xGax alloys (x = 0, 0.5, 1, and 4) are shown in **Figure 4(a–d)**. **Table 1** represents the average and nominal composition variations for the alloys with x = 0–6. The deviation reported is on the basis of measurements taken from four to six regions of the sample. The percentage experimental error in the case of Ga is found to be highest. The analysis shows Ga is responsible for contrast variation because of two kinds of amorphous domains in Ce75Al25 − xGax alloys. Within the traceable limit of EDX, the presence of silicon (Si) could not be found. Because of very fine droplet-like features (<7 nm), it is not possible to characterize the variation of Ga in amorphous matrix as well as droplet-like structure. For compositional analysis in TEM, the probe size is ~50 μm at magnification of 13.5 k. That's why only nominal and average composition of Ga is shown.
