Author details

Mohammed Ziyan Sheriff1,2, Nour Basha2 , Muhammad Nazmul Karim<sup>1</sup> , Hazem Nounou<sup>3</sup> and Mohamed Nounou2 \*

1 Artie McFerrin Department of Chemical Engineering, Texas A&M University, College Station, TX, USA

2 Chemical Engineering Program, Texas A&M University at Qatar, Doha, Qatar

3 Electrical and Computer Engineering Program, Texas A&M University at Qatar, Doha, Qatar

\*Address all correspondence to: mohamed.nounou@qatar.tamu.edu

© 2019 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/ by/3.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Fault Detection of Single and Interval Valued Data Using Statistical Process Monitoring… DOI: http://dx.doi.org/10.5772/intechopen.88217
