Meet the editor

Dr. Luigi Cocco is a professional engineer with 15 years of experience in the automotive industry. He worked in electrical and electronic R&D and supply quality departments of racing/luxury/premium Italian vehicle manufacturers such as the Ferrari F1 Team, Automobili Lamborghini, and Alfa Romeo. Currently, he is ADAS System Responsible in Maserati S.p.A.

After his Master's degree in Telecommunication Engineering, he received his PhD in Information Engineering. He has published several papers and conference contributions on electronic measurements and digital signal processing. *Modern Metrology Concerns* and *New Trends and Developments in Metrology* are books edited by Luigi Cocco for IntechOpen respectively in 2012 and 2016.

Contents

**Preface III**

**Chapter 1 1**

**Chapter 2 23**

**Chapter 3 43**

**Chapter 4 65**

**Chapter 5 79**

Metrological Traceability at Different Measurement Levels

Third-Order Nonlinear Optical Properties of Quantum Dots

Biotoxicological Monitoring of Organic Solvents in the Tunisian

*by Imed Gargouri, Fatma Omrane and Moncef Khadhraoui*

Self-Calibration of Precision XY*θz* Metrology Stages

Analysis of Pulsating White Dwarf Star Light Curves

*by Oleh Velychko and Tetyana Gordiyenko*

*by Chuxiong Hu, Yu Zhu and Luzheng Liu*

*by Khalil Ebrahim Jasim*

*by Denis J. Sullivan*

Footwear Industry

## Contents


Preface

The goal of acceptable quality, cost, and time is a decisive challenge in every

congruous list of references is available at the end of each section.

**1. Metrological Traceability at Different Measurement Levels**

**2. Self-Calibration of Precision XYθz Metrology Stages**

**3. Third-Order Nonlinear Optical Properties of Quantum Dots**

**4. Analysis of Pulsating White Dwarf Star Light Curves**

The volume has been divided into five chapters:

results by different countries.

practical industrial requirements.

engineering development process. To be familiar with metrology requires choosing the best combination of techniques, standards, and tools to control the project from advanced simulations to final performance measurements and periodic inspections. This book contains a cluster of chapters from international academic authors who provide a meticulous way to discover the impacts of metrology in both theoretical and application fields. The approach is to discuss the key aspects of a selection of untraditional metrological topics, covering the analysis procedures and set of solutions obtained from experimental studies. Each chapter is designed for both the engineering and academic communities and is partitioned as a scientific paper; a

*Chapter 1* presents the basis of global metrological traceability and the standards of comparison of different regional metrology organizations. A procedure to evaluate specific interlaboratory results on national and international levels is described. This method can contribute the mutual recognition of measurement and testing

*Chapter 2* studies the on-axis calibration for precision XYθz metrology stages, and presents a holistic XYθz self-calibration approach. The proposed approach uses an artifact plate specially designed with XY grid mark lines and angular mark lines as a tool, to be measured by the XYθz metrology stages. Computer simulation is conducted and the designed artifact plate is illustrated to meet

*Chapter 3* introduces quantum dots (QDs), which are semiconducting nanocrystalline particles and attractive photonic media. Third-order nonlinear optical properties and a brief idea of the physics of QDs are discussed; the Z-scan technique and theoretical analysis adopted to obtain nonlinear parameters are detailed. Despite their size, QDs represent a good example of optical limiters with low threshold.

*Chapter 4* is focused on analysis techniques for extracting the frequencies contained in the light curves of pulsating white dwarf stars. In several surface temperature regimes, these astronomical objects are unstable to gravity mode pulsations, which result in brightness variations corresponding to the periods of the excited modes.
