Author details

The heating of TiO2 powder mixtures with SiO2 nanoparticles at a temperature of 150, 400, and 800С cannot lead to the formation of new phases, because even at a higher heating temperature (900, 1000, and 1200С) of TiO2 + SiO2 powder mixtures, the Ti(1x)SixO2 solid solution is

Figure 11. X-ray diffraction patterns of TiO2 powders modified with SiO2 nanoparticles at a variety of heating temperatures.

A certain contribution to the increase in radiation stability at the highest heating temperature in the present studies, equaled to 800C, can be made by changing the phase state of TO2 powder the conversion of anatase to rutile, which is carried out at a temperature of 450–900C. The transition temperature is determined by the degree of crystallinity of the compound (films,

When SiO2 particles are added to the TiO2 powder, the phase transition is facilitated: transition temperature reduces and the relative rutile concentration increases [33]. Therefore, the TiO2 powder mixtures with SiO2 nanoparticles heated at 800C can give an increase in the relative rutile concentration, a change in the particle size and specific surface area, the concentration of absorbed gases, and stability to an impact of electron exposure. A confirmation of the increase in rutile concentration with increasing temperature is the results of X-ray phase analysis (Figure 11), which show that an increase in the heating temperature from 150–400C does not change the phase ratio, and further increase to 800C leads to the formation of rutile in an amount 10 mass%.

In this chapter, the optical properties and radiation stability of titanium dioxide powders before and after modification by nanopowders of various oxide compounds (Al2O3, ZrO2, SiO2, TiO2,

polycrystals, and single crystals), the concentration of defects, and other factors [34, 35].

not formed [33].

500 Titanium Dioxide - Material for a Sustainable Environment

5. Conclusions

ZnO, and MgO) are considered.

Mikhail M. Mikhailov<sup>1</sup> , Vitaly V. Neshchimenko1,2, Semyon A. Yuryev1 \* and Alexey N. Sokolovskiy<sup>3</sup>

\*Address all correspondence to: yusalek@gmail.com

1 Radiation and Space Materials Laboratory, Tomsk State University of Control Systems and Radio-electronics, Tomsk, Russia

