**3. Structure and conduction properties in foil ferrites**

This section discusses structure and conduction properties in foil ferrites. It then reviews general capabilities of x-ray diffraction (XRD) and electrical characterization techniques for the study of foil ferrites and behavior with emphasis on knowledge of their properties. The interrelation of structure and conduction properties as a function on their magnetic ordering is the key issue in green electronic device design.

Usually, copper source with CuKα radiation (λ = 0.154 nm) is employed in x-ray diffraction studies; however, features of Mn-Zn ferrites at higher wavelengths are indistinguishable. Thereby, a PANalytical x-ray diffractometer with CoKα radiation (λ = 0.179 nm) is used here to obtain XRD patterns in foil ferrite samples. Cobalt source allows higher diffraction angles and peak spreads. Current-voltage measurements are performed by using a digital storage oscilloscope (Tektronix, TDS1012C) at room temperature. A function generator (Matrix, MFG-8250A) is used to produce a linear-ramp signal at low frequency (f = 100 Hz) with voltage scanned from −10 V to 10 V to ensure that the magnetic saturation in the samples does not occur.
