**Meet the editor**

Editor, Momcilo M. Pejovic received his BSc degree in Physics at the University of Belgrade, Serbia, and his MSc and PhD degrees in Electronics at the University of Nis, Serbia, in 1968, 1977, and 1980, respectively. In 1968, he worked at Electronic Industry Nis, Serbia. Between 1973 and 2011, he has worked at the Faculty of Electronic Engineering, University of Nis, as a professor of

Physics and is now currently retired. He has authored and coauthored 15 books and more than 250 research papers, among which more than 115 papers have been published in international journals. His research interests include the reliability of field-effect transistors, application of MOSFET dosimeters, characterization of vacuum and gas-filled electrical devices and electrical discharge, and recombination processes in the afterglow periods in gases.

Editor, Milic M. Pejovic received his BSc and MSc degrees in Electronics at the University of Nis, Serbia, and PhD degree in Electronics at the University of Belgrade, Serbia, in 1999, 2003, and 2007, respectively. In 2002, he worked for Philips Semiconductor Company, Southampton, UK, in the DVD application sector. In 2007, he worked in Tyndall National Institute as visiting re-

searcher. Currently, he is working as an assistant professor at the Faculty of Electronic Engineering, University of Nis. He has authored or coauthored more than 55 research papers, including 40 papers in international journals and coauthored 2 books. His research interests include process control and measurements as well as the reliability of field-effect transistors and MOSFET dosimeters and electrical characterization of vacuum and gas-filled components.
