**Author details**

Nikolay Ivanov<sup>1</sup> , Valery Losev1,2\*, Yury Panchenko<sup>1</sup> and Viktor Tarasenko1,2

\*Address all correspondence to: losev@ogl.hcei.tsc.ru

1 Institute of High Current Electronics SB RAS, Tomsk, Russia

2 National Research Tomsk Polytechnic University, Tomsk, Russia
