**Past, Present and Future Molecular Approaches to Improve Yield in Wheat**

Sue Kyung Kim, Jin-Ho Kim and Won-Cheoul Jang

Additional information is available at the end of the chapter

http://dx.doi.org/10.5772/67112

#### **Abstract**

This chapter addresses the development and use of molecular markers for yield enhancement in wheat. Since their key goal for breeding is to maximize yield, extensive efforts have been made toward the improvement of yield. Agronomic traits related to yield, yield-related, disease resistance, and abiotic stresses are considered to be quantitative traits (QTLs), also known as complex traits, because they are controlled by numerous genes and are affected by environmental factors. Researchers have been studying such traits in the past decades for the development of molecular markers which can be used in various wheat breeding studies mainly involving restriction fragment length polymorphism (RFLP), simple sequence repeat (SSR), single nucleotide polymorphism (SNP), random amplified polymorphic DNA (RAPD), and amplified fragment length polymorphism (AFLP). Furthermore, the advent of next-generation sequencing (NGS) has accelerated the discovery of agronomically important genes. All of the technologies have enabled great advances for increasing the productivity of wheat. Here, the past history of first-generation sequencing, present status of second-generation sequencing, and future potential of translational genomics linked to the yield will be discussed.

**Keywords:** molecular markers, yield, quantitative traits (QTLs), next-generation sequencing (NGS)
