**Author details**

At the ESCA, microscopy beamline of the Elettra synchrotron, a dynamic high pressure (DHP) system, has been recently developed. This setup is a solution adaptable to existing synchrotron‐based XPS spectroscopes and microscopes, which allows to overcome the pressure constraints of photoemission technique (high vacuum or ultra‐high vacuum) and to operate up to mbar range. The success of the first near ambient pressure scanning photoelectron microscopy experiment manifests that the developed novel solutions can pave the road to ambient pressure photoelectron spectromicroscopy, allowing for instance the characterization of cata-

**Figure 2.** Schematic representation of some X‐ray–based techniques due to the interaction of synchrotron radiation with

In this book, five chapters on synchrotron‐based characterization of nanostructured materials

lytic systems near real condition [4].

matter (Courtesy of Elettra Sincrotrone Trieste).

4 X-ray Characterization of Nanostructured Energy Materials by Synchrotron Radiation

related to energy applications have been collected.

**Figure 3.** Schematic of beamline BL28XU at SPring‐8 in Japan [3].

Mehdi Khodaei<sup>1</sup> \* and Luca Petaccia2

\*Address all correspondence to: mehdi.khodaii@gmail.com, khodaei@kntu.ac.ir

1 Faculty of Materials Science and Engineering, K. N. Toosi University of Technology, Tehran, Iran

2 Elettra Sincrotrone Trieste, Trieste, Italy
