**Author details**

Jean-Luc Autran1,3\*, Daniela Munteanu1,3, Soilihi Moindjie1,3, Tarek Saad Saoud1,3, Victor Malherbe2,3, Gilles Gasiot2,3, Sylvain Clerc2,3 and Philippe Roche2,3

\*Address all correspondence to: jean-luc.autran@univ-amu.fr

1 Aix Marseille University, University of Toulon, CNRS, IM2NP, Marseille, France

2 STMicroelectronics, Crolles, France

3 Radiation Effects and Electrical Reliability (REER) Joint Laboratory, Aix Marseille Univer‐ sity, University of Toulon, CNRS and STMicroelectronics, Marseille, France
