**1. Introduction**

Electron beam irradiation has been effectively utilized in power cable industry and identi‐ fied as one of the most advanced processing techniques. The products processed with electron beam radiation, experience shorter exposure time, which could result in less oxidative effects on certain materials. It is essential to investigate the effect of electron beam irradiation upon the dielectric parameters of the five different compositions of SiR–EPDM blends [1–4, 9]. Hence, the samples of SiR–EPDM were irradiated to 5, 15 and 25 Mrad dose levels by electron beam accelerator. The new functional groups formed during blending and after the electron beam irradiation were investigated through physicochemical investigation techniques like Fourier transform infrared spectroscopy (FTIR). To observe the morphological changes and

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also to identify the elemental composition, scanning electron microscope (SEM) analysis and energy dispersive X-ray analysis (EDXA) were performed on SiR–EPDM blends. The effects of electron beam irradiation on the dielectric parameters of various compositions of SiR– EPDM blends were reported.
