*3.2.2. Energy dispersive X-ray (EDXA) analysis*

EDXA analysis has been performed using EDXA analysis setup (Make HITACHI), in order to determine the elemental composition of the materials at the surface of the electron beam irradiated samples of SiR–EPDM blends.

#### *3.2.3. Scanning electron microscopy (SEM) analysis*

SEM analysis was performed using a scanning electron microscope (Make HITACHI) with a magnification of 5–300,000, in order to study the morphology of the surface of electron beam irradiated samples of SiR–EPDM blends.
