**Author details**

Aurangzeb Khan1\* and Yamaguchi Masafumi2

\*Address all correspondence to: akhan@southalabama.edu

1 Department of Electrical and Computer Engineering, University of South Alabama, Mo‐ bile, AL, USA

2 Toyota Technological Institute, 2-12-1 Hisakata, Tempaku, Nagoya, Japan

This chapter is an expanded version of the authors' earlier proceedings paper [31] (© 2006 IEEE. Excerpts reprined with permission).
