Characterization of Defects Evolution in Bulk SiC by Synchrotron X-Ray Imaging **Characterization of Defects Evolution in Bulk SiC by Synchrotron X-Ray Imaging**

T. S. Argunova, M. Yu. Gutkin, J. H. Je, J. H. Je, V. G. Kohn and E. N. Mokhov

V. G. Kohn and E. N. Mokhov Additional information is available at the end of the chapter

T. S. Argunova, M. Yu. Gutkin,

Additional information is available at the end of the chapter

http://dx.doi.org/10.5772/52058
