**3. Characterization**

X-ray diffraction data were recorded using a Bruker diffractometer using Cu K*a* radiation. The chemical compositions of Na+-titanosilicate and H+-titanosilicate were analyzed by energy dispersive spectroscopy (EDS; Link system AS1000-85S) and by thermo-gravimetric analysis (TGA; Dupont 9900 thermoanalyser, 10 oC/min to 900 oC, 100 ml/min N2 purge). Scanning electron micrograph (SEM) measurements were carried out using a JEOL JSM-840A SEM. Samples, were stuck onto adhesive tape, sputter coated with gold and morphological variations were examined. Transmission electron micrographs (TEM) were obtained with a JEOL JEM-200 CX transmission electron microscope operating at 200 kV, using a thin-section technique. Powdered samples were embedded in Epoxy resin and then sectioned with a diamond knife. Microtome sectioned samples were examined. Solid-state 29Si MAS NMR experiments were performed on a Bruker DSX-400 spectrometer (KBSI Daegu center, Korea) operating at 79.5 MHz. 29Si MAS NMR spectra were obtained using 30- 40o pulse width at a spinning rate of 6 kHz. Cross-polarization experiments were carried out with delay times of 3 s, 90o pulse of 5 s, and contact times of 2000 μs. The chemical compositions of Na+-titanosilicate and H+-titanosilicate were analyzed by energy-dispersive X-ray spectrometer (EDS, Link system AS1000–85S) and thermogravimetric analysis (TGA, 10 oC/min to 900 oC, 100 cm3/min N2 purge). The composition of the product was determined by CHN analysis (CHNS-932 (Leco)). The FT-IR spectrum was recorded on a Digilab FTS-40 FT-IR unit using the KBr disk method. Raman spectra were obtained using a Jobin Yvon/Horiba LabRAM spectrometer equipped with an integral microscope (Olympus BX 41). The 632.8 nm line of an air-cooled He/Ne laser was used as an excitation source.
