**8. References**


Finally, we have shown the existence of localized dipole fields in the vicinity of steps through direct measurements of the forces experienced by a biased STM tip. Together with measurements of the tip radius (from force-distance curves) and tip-sample distance (from current-distance approach curves) in the course of the same experiment, the method provides a direct way to map out and to measure local dipole moments on surfaces that

The work presented here was done at Materials Sciences Division, Lawrence Berkeley

Many thoughts, analyses, suggestions, and conclusions in this work were generated from research by and discussions with the following people: Dr. R.W. Carpick, Dr. D. F. Ogletree, Dr. J. Y. Park, Dr. R.J.A. van den Oetelaar, Dr. X. Lei, Mr. D. Schleef and Dr. M. Salmeron. This work was supported by the Director, Office of Energy Research, Office of Basic Energy Sciences, Materials Sciences Division, of the U.S. Department of Energy under Contracts No. DE-AC03-76SF00098, DE-FG02-02ER46016, and DE-AC02-05CH11231. Also, this work was supported by the Ministry of Education, Research, Youth and Sport, Romania, and by the European Union through the European Regional Development Fund, and by Romanian National Authority for Scientific Research, under project POSCCE-O 2.1.2-2009-

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**7** 

*Brazil* 

**Measurement of the Nanoscale Roughness by** 

Nanoscale science is the study of objects and phenomena at a very small scale and it has been an emerging, interdisciplinary science involving Physics, Biology, Chemistry, Engineering, Material Science, Computer Science and other areas. The main interest in studying in the nanoscale is related to how nanosized particles have different properties than large particles of the same substance. Nanoscale science allow us to learn more about the nature of matter, develop new theories, discover new questions and answers in many areas including health care, energy and technology and also discover how to make new technologies and products that can improve people's life. Although nanoscale science is a recent development in the scientific community, the development of its main concepts happened over a long period of time and the emergence of nanotechnology is related to experimental advances such as the invention of the Scanning Probe Microscope (SPM), a branch of microscopy that captures

SPM was founded with the invention of the Scanning Tunneling Microscope (STM) in 1982 at IBM in Zurich by Binning (Binning et al., 1982). The tip-sample interaction in STM is based on a tunneling electrical current. Although the ability of the STM to image and measure the material surface with atomic resolution has caused a great impact on the technology community, the tip-sample interaction in STM is limited only for good electrical conductor or semiconductor materials. The need of studying other materials led to the development, in 1986, of the Atomic Force Microscopy (AFM) by Binning, Quate, and Gerber (Binnig et al., 1986) that enabled the detection of atomic scale features on a wide

SPM is defined as a specific type of microscopy that uses the basic principle of scanning a surface with a very sharp probe to image and measure properties of material, chemical and

surface imagery using physical probes that scan the specimen.

**1. Introduction** 

range of insulating surfaces.

**2. Basic principles** 

1 Corresponding Author

**Atomic Force Microscopy:** 

*Federal University of São Carlos, Campus Sorocaba* 

F.M. Yamaji and F.L. Leite1

**Basic Principles and Applications** 

R.R.L. De Oliveira, D.A.C. Albuquerque, T.G.S. Cruz,

