**10. References**


In the example given in Figure 26, the composed wave equation is the sum of each of the four waves. The surface can thus be divided into height parameters and parameters of wavelength. The figure shows that the first wave contributes to the larger waves while the

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fourth wave contributes to reduced ripples

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**10. References** 


*of 84th General Session & Exhibition of the IADR*, ISBN, Brisbane-Australia, June 28- July 1.

**8** 

*USA* 

**Predicting Macroscale Effects** 

**Through Nanoscale Features** 

*Southern Polytechnic State University, Marietta, GA* 

Atomic force microscopy is extremely useful in the study of surface defects in crystals by providing topographical data at the nanometric scale. With the aide of advanced statistical analysis, nanoscale surface data acquired through atomic force microscopy can also be utilized to predict behavior at the macroscale. The behavioral model presented is the measure of shock sensitivity required to produce detonation of explosive crystal test samples. The surfaces studied were of 7 different varieties of (RDX) crystalline explosives from 5 manufacturers (Doherty & Watts, 2008). It has been speculated that particle size, crystal defects, density and crystal morphology may play a role in the shock sensitivity of RDX and there have been numerous attempts to quantify and/or link particular features of the explosive particles to the shock sensitivity behavior of their larger compositions (Doherty and Watts, 2008). The shock sensitivity data were obtained from model test compositions prepared as polymer-bonded explosives using hydroxy-terminated polybutadiene (HTPB) as the binder. The shock sensitivity, measured in a gap test, is the shock required to produce a detonation of the test composition 50% of the time. Varied card thicknesses of poly(methyl-methacrylate) (PMMA) are used to attenuate the initiating charge entering the sample tube. The shock pressure (GPa) impacting the sample is determined by the number of cards. A small number of cards translate to a larger shock and

The AFM analysis of the RDX crystal surfaces was performed using a Multimode V scanning probe microscope (Veeco Metrology Group). The instrument was operated in Tapping Mode, where topographical analysis is performed with minimal contact of the surface. The crystal topography is mapped by lightly tapping the surface with an oscillating probe tip. The sample surface topography modifies the cantilever's oscillation amplitude and the topography image is obtained by monitoring these changes while closing the z feedback loop to minimize them. A first order algorithm supplied by Veeco was used to "flatten" the images. The flatten command modifies the scanned image removing tilt and

**1. Intoduction** 

thus a less shock sensitive sample.

**2. Experimental** 

thus leveling the image.

Victor J. Bellitto1 and Mikhail I. Melnik2

*1Naval Surface Warfare Center 2School of Engineering Technology,* 

