**Meet the editor**

Dr. Victor J. Bellitto is currently a research scientist with the Naval Surface Warfare Center in Indian Head, Maryland, where he is a member of the Research & Technology Division. He was the recent recipient of the 2010 Naval Sea Systems Command (NAVSEA) scientist of the year award for work in energetic materials. Dr. Bellitto earned his B. S. degree in Physics from Florida International

University in 1987. He later continued his education, receiving his M. S. in Physics from Georgia State University in 1995 with the thesis entitled Positron Annihilation Studies of Beta-Cyclodextrin Complexed with Benzyl Salicylate, Benzyl Acetate, and Ethyl Salicylate. In 1999 he earned his Ph. D. in Physics from Georgia State University with his dissertation entitled The Interaction of Hydrogen with the GaN(0001)Surface. In 2000, he was awarded the NRC Post-Doctoral research fellowship at the Naval Research Laboratory in Washington, D. C.

Contents

**Preface IX** 

Vishal Gupta

Chapter 2 **Atomic Force Microscopy** 

Chapter 3 **Magnetic Force Microscopy:** 

Thin-Lin Horng

Chapter 5 **Wavelet Transforms in Dynamic** 

Marius Enachescu

F.M. Yamaji and F.L. Leite

**Through Nanoscale Features 175**  Victor J. Bellitto and Mikhail I. Melnik

Chapter 8 **Predicting Macroscale Effects** 

Martin Veis and Roman Antos

Chapter 4 **Vibration Responses of Atomic Force Microscope Cantilevers 57** 

> **Atomic Force Spectroscopy 71**  Giovanna Malegori and Gabriele Ferrini

Chapter 6 **Nanoscale Effects of Friction, Adhesion and Electrical Conduction in AFM Experiments 99** 

Chapter 7 **Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications 147**  R.R.L. De Oliveira, D.A.C. Albuquerque, T.G.S. Cruz,

Chapter 9 **AFM Application in III-Nitride Materials and Devices 189** 

Z. Chen, L.W. Su, J.Y. Shi, X.L. Wang, C.L. Tang and P. Gao

Chapter 1 **Crystal Lattice Imaging Using Atomic Force Microscopy 1** 

**in Optical Imaging and Characterization 19** 

F.A. Ferri, M.A. Pereira-da-Silva and E. Marega Jr.

**Basic Principles and Applications 39** 
