**SCANNING PROBE MICROSCOPY – PHYSICAL PROPERTY CHARACTERIZATION AT NANOSCALE**

Edited by **Vijay Nalladega** 

**INTECHOPEN.COM**

http://dx.doi.org/10.5772/2653 Edited by Vijay Nalladega

#### **Contributors**

Xuefeng Li, Shao Xian Peng, Han Yan, Vijay Nalladega, Kumar Jata, Shamachary Sathish, Mark Blodgett, Tetsuya Matsunaga, Eiichi Sato, Haleh Kangarlou, Saeid Rafizadeh, Vo Thanh Tung, Chizhik Sergei A., Tran Xuan Hoai, Nguyen Trong Tinh, Chikunov V.V., Josefina Alvarado-Rivera, Juan Munoz-Saldana, Rafael Ramírez-Bon, Eralci Moreira Therézio, Maria Leticia Veja, Roberto Mendonça Faria, Alexandre Marletta, Svetlana Viktorovna Kononova, Mei Wang, Lelia Ciontea, Mihai Gabor, Traian Petrisor Jr., Tania Ristoiu, Coriolan Tiusan, Traian Petrisor

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First published in Croatia, 2012 by INTECH d.o.o. eBook (PDF) Published by IN TECH d.o.o. Place and year of publication of eBook (PDF): Rijeka, 2019. IntechOpen is the global imprint of IN TECH d.o.o. Printed in Croatia

Legal deposit, Croatia: National and University Library in Zagreb

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Scanning Probe Microscopy - Physical Property Characterization at Nanoscale Edited by Vijay Nalladega p. cm. ISBN 978-953-51-0576-3 eBook (PDF) ISBN 978-953-51-4998-9
