**INTERFEROMETRY – RESEARCH AND APPLICATIONS IN SCIENCE AND TECHNOLOGY**

http://dx.doi.org/10.5772/2635 Edited by Ivan Padron

## **Contributors**

Cruz Meneses-Fabian, Gustavo Rodriguez-Zurita, Noel-Ivan Toto-Arellano, Amalia Martínez-García, David Ignacio Serrano García, Sara Tofighi, Marzieh Bathaee, Ali Reza Bahrampour, Farnaz Farman, Cheng Chih Hsu, Luis Esteban-Hernández, Miguel Sánchez Gómez, Wee Keat Chong, Xiang Li, Yeng Chai Soh, Morel, Fotis Kossivas, Andreas Kyprianou, Charalambos Doumanidis, Takeshi Tsujimura, Michał Arabski, Sławomir Wąsik, Zuzanna Drulis-Kawa, Hubert Grześkiewicz, Jerzy Gubernator, Wiesław Kaca, Xiaoji Zhou, Xuguang Yue, Makarova, Valery Kulichikhin, Akira Kimachi, Levon Mouradian, Aram Zeytunyan, Garegin Yesayan, Tae Hyun Baek, Uriel Rivera-Ortega, Akos Ledeczi, Sandor Szilvasi, Janos Sallai, Peter Volgyesi, Miklos Maroti, Graciela Hernández-Orduña, Masanori Ota, Tatsuro Inage, Shinsuke Udagawa, Kazuo Maeno, Babu Varghese, Wiendelt Steenbergen

## **© The Editor(s) and the Author(s) 2012**

The moral rights of the and the author(s) have been asserted.

All rights to the book as a whole are reserved by INTECH. The book as a whole (compilation) cannot be reproduced, distributed or used for commercial or non-commercial purposes without INTECH's written permission. Enquiries concerning the use of the book should be directed to INTECH rights and permissions department (permissions@intechopen.com).

Violations are liable to prosecution under the governing Copyright Law.

Individual chapters of this publication are distributed under the terms of the Creative Commons Attribution 3.0 Unported License which permits commercial use, distribution and reproduction of the individual chapters, provided the original author(s) and source publication are appropriately acknowledged. If so indicated, certain images may not be included under the Creative Commons license. In such cases users will need to obtain permission from the license holder to reproduce the material. More details and guidelines concerning content reuse and adaptation can be foundat http://www.intechopen.com/copyright-policy.html.

## **Notice**

Statements and opinions expressed in the chapters are these of the individual contributors and not necessarily those of the editors or publisher. No responsibility is accepted for the accuracy of information contained in the published chapters. The publisher assumes no responsibility for any damage or injury to persons or property arising out of the use of any materials, instructions, methods or ideas contained in the book.

First published in Croatia, 2012 by INTECH d.o.o. eBook (PDF) Published by IN TECH d.o.o. Place and year of publication of eBook (PDF): Rijeka, 2019. IntechOpen is the global imprint of IN TECH d.o.o. Printed in Croatia

Legal deposit, Croatia: National and University Library in Zagreb

Additional hard and PDF copies can be obtained from orders@intechopen.com

Interferometry - Research and Applications in Science and Technology Edited by Ivan Padron p. cm.

ISBN 978-953-51-0403-2 eBook (PDF) ISBN 978-953-51-4985-9
