**11. Conclusion**

There exists a plenty of other roughness characteristics based on standard statistics or analysis of spatial processes which can be used for separation of noise and waviness (macro roughness). For evaluation of suitability of these characteristics it will be necessary to compare results from sets of textile surfaces.

For deeper analysis of SHV traces from KES device the rough signal registration and digitalization by using of LABVIEW system is beneficial.

The analysis of SHV can be more complex. The other classical roughness characteristics and topothesy can be computed as well and many other techniques of fractal dimension calculation can be included. The analysis can be extended to the chaotic models and autoregressive models. With some modifications it will be possible to use these techniques for characterization of the SHV or surface profiles obtained by other techniques.

The contact less measurement of fabric images by using of RCM device is useful for description of relief in individual slices and in the whole fabric plane.
