**4.1 Analysis of conductive coupling**

194 Wireless Communications and Networks – Recent Advances

Fig. 18. Different coupling mechanisms.

LCD panel.

Fig. 19. Illustration of possible noise coupling for wireless device.

Fig. 20. EM interaction between TP and embedded antenna.

The Figure 20 illustrates the EM interaction between TP and embedded antenna, and the photograph of Figure 21 shows the DCS1800 and PCS 1900 transmitted power coupled to The first step of the degradation of sensitivity (De-sense) measurement is conducted testing, because understanding how the interference platform noise conducted to the RF receiver is the most important issue for further analysis. Even the same probability distribution function of noise, there is possible to cause different De-Sense impact depending on the receiver implementation.

The best way to obtain the conducted De-Sense effect is to use the internal WWAN module or chip set of mobile device for RSSI measurement as shown later in Figure 25. The left figure shows a 50 ohm terminated at antenna connector to read the WWAN RSSI data. The figure in the center shows the dummy WWAN module with circuit ground and chassis ground, and the WWAN card inside the shielded box is connect to the dummy WWAN card via coaxial cable to read the RSSI data again. The right figure shows the dummy WWAN module with chassis ground and WWAN card to read the RSSI data. The RSSI data read from the same RF receiver with three different conditions described above will help engineers easily identify the platform noise.
