**Section 4**

220 Modern Metrology Concerns

[21] Rivas-López M., Oleg Sergiyenko, Vera Tyrsa, Wilmar Hernandez Perdomo, Daniel

[22] Oleg Segiyenko, Daniel Hernandez B., Vera Tyrsa, Patricia Luz Aurora Rosas Méndez,

3404. ISBN 978-1-4244-4649-0/09.

10.1177/1475921709340975

2241 - doi:10.1016/j.measurement.2008.04.009

Industrial Electronics (IECON'09), 3-5 November, 2009, Porto, Portugal, pp.3399-

Hernandez B., Luis Devia Cruz, Larisa Burtseva, Juan Iván Nieto Hipólito. *Optoelectronic method for structural health monitoring.* SAGE Publications, International Journal of Structural Health Monitoring, Vol.9, No.2, March, 2010, pp.105-120. Issue Online, September,24, 2009, ISSN 1475-9217 / doi:

Moisés Rivas Lopez, Filmar Hernandez, Mikhail Podrygalo, Alexander Gurko. Analisis of jitter influence in fase frequency measurements. Elsevier, "Measurement", Volume 46, Issue 7, Agoust 2011, Pages 1209-1328. ISSN: 0263**Optics** 
