**Table 1.**

*Sputtering yield simulation by SRIM 2013 code [13].*

**Figure 7.**

*Scanning electron microscopy images of the interdendritic region irradiated, (a) interdendritic region and (b) eutectic colonies.*

In the images shown in **Figure 7**, in addition to the pattern of valleys and ridges, other changes generated by irradiation can be clearly seen, craters and in **Figure 7(b)** it is observed how the boundary between eutectic colonies was sputtered, which denotes the high susceptibility to the chemical composition local variation of sputtering process induced by ion beam irradiation.
