**Author details**

Hai Ha Pham Thi1 and Thanh Luan Nguyen2 \*

1 NTT Hi-Tech Institute, Nguyen Tat Thanh University, Ho Chi Minh City, Vietnam

2 Department of Science, Technology and International Affairs, HUTECH University, Ho Chi Minh City, Vietnam

\*Address all correspondence to: nt.luan@hutech.edu.vn

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