*3.2.1 Sequential analysis of the distribution of metallic constituents in geological samples*

Micro-area analysis of geological samples, such as minerals, can provide information on the concentration and distribution of the elements, which is essential for studying the metallogenic mechanism and understanding the structure. In general, laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS) [35], second ion mass spectroscopy (SIMS) [36], proton-induced X-ray emission spectroscopy (PIXRES) [37], etc. were widely used in the micro-area analysis of minerals with point-by-point scanning, which has the advantage of high spatial resolution and disadvantage of time-consuming. Thus, a novel analytical strategy for rapid micro-area analysis is needed. For instance, using a sequential ionization device (**Figure 1**) coupled with MS, the speciation (S) and concentration (C) of the metal in the geological samples can be obtained sequentially with time (T) by MS to establish the relationship Y(S, C) = F(T). Meanwhile, the Microstructure morphology imaging system in the sequential ionization device can record the change of morphology (M) in real time to establish the relationship Y(M) = F(T). By combining the relations the Y(S, C) = F(T) and Y(M) = F(T), a relationship between (S, C) and (M) could be established as Y(S, C) = F(M), which would be the distribution of metal speciation.

*Sequential Speciation Analysis of Metals in Geological Samples by Mass Spectrometry DOI: http://dx.doi.org/10.5772/intechopen.110447*
