**3.1 PENQ characterization**

After complete synthesis of PENQ its structural and morphological characterization were done using these techniques. **Figure 1** depicts the XRD of crystal-line monoclinic PENQ. The XRD diffraction peaks at 9.80, 12.00, 15.01, 23.60 and 27.70° matches with (002), (011), (012), (112) & (104) reflection planes, respectively. For the study of optical properties of PENQ, UV-Visible & Photoluminescence spectra as shown in **Figure 1**. The band gap of PENQ found near 3 eV. Cyclic voltammetry was used for finding the possible band structure of PENQ semiconductor.

A FE-SEM photos in the UV image shows the plate like structure with thickness around 60 nm. There is a stacking of uneven shaped plates and seems to be highly crystalline.
