**Author details**

Zhenguo Zhang<sup>1</sup> , Piao Fan<sup>2</sup> , Yikun Dong<sup>2</sup> , Shuai Yu<sup>2</sup> , Keping Liu2 \* and Xiaohui Lu1

1 School of Mechatronic Engineering, Changchun University of Technology, Changchun, China

2 School of Electrical and Electronic Engineering, Changchun University of Technology, Changchun, China

\*Address all correspondence to: liukeping@ccut.edu.cn

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