**3.1 Working principle**

The scanning electron microscope consists of three main parts: optical column, sample chamber, and imaging (**Figure 2**) [8]. In the optical part, it forms the electron gun, which is the source of the electron beam. In this part, there is an anode plate to which high voltage is applied to accelerate the electrons falling on the sample, condensing lenses to ensure uniform electron beam formation, objective lens to focus, and apertures of different diameters to adjust the density of this lens. Magnetic lenses and deflectors located here thin the electron beam coming from the electron gun and focus it on the sample surface. This system, namely the optical column, is kept in a vacuum of 10−4–10−7 Pa. In the image system, there are detectors that collect the electrons and radiations formed as a result of the sample interference with the incoming electron beam. These detectors amplify electrons or signals that are reflected or interfering from the surface. At the same time, these detectors multiply these signals and convert them into digital signals and send them to the screen through video multipliers [9].
