**2.2 Characterization**

The phase identification of the pure cum composite samples was analyzed by using the X-ray diffraction (XRD) system with an ULTIMA-IV diffractometer of Cu source of radiation. The diffraction data were taken in the range of 20–60° with a slow scan rate of 3 degrees per minute. The surface morphology and elemental analysis were characterized through the scanning electron microscope (SEM) coupled with the energy dispersive X-ray spectrometer (EDAX). The size of the grains was estimated from the Image J Software. The samples magnetic properties were studied at room temperature (RT) using the vibrating sample magnetometer (VSM) with a maximum magnetic field of 15 kOe. For the electrical measurement samples were painted with high-quality silver paste to form an electrode. The RT frequency variation of dielectric permittivity at a constant magnetic field (0 to 1.3 T with a difference of 0.2 T) was studied through the impedance analyzer (Waynee Kerr 6500B model). The magnetic field variation of MD and magnetoloss was recorded by an impedance analyzer, which is assembled with the closed cycle refrigerator (CCR) system, KEPECO power supply, and the electromagnet (GMW 5034).
