Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

*Edited by Chandra Shakher Pathak and Samir Kumar*

Published in London, United Kingdom

## *Supporting open minds since 2005*

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization http://dx.doi.org/10.5772/intechopen.94185 Edited by Chandra Shakher Pathak and Samir Kumar

#### Contributors

Yi Zhu, Leonid I. I. Goray, Marco Coisson, Paola Tiberto, Gabriele Barrera, Federica Celegato, Chandra Shakher Pathak, Luciano H. Honorato Chagas, Sandra Shirley Ximeno Chiaro, Alexandre Amaral Leitão, Renata Diniz, Nikiwe Mhlanga, Phumlani Tetyana, Sanele Nyembe, Lucky Sikhwivhilu, Mahfujur Rahaman, Dietrich R. T. Zahn, M.H. Wathsala N. Jinadasa, Maths Halstensen, Klaus-Joachim Jens, Amila C. Kahawalage, Nils-Olav Skeie, Shan Yang, Yahachi Saito, Koji Asaka, Lucia Kiyomi Noda, Karthikeyan Krishnamoorthy, Sang-Jae Kim, Dorota Puchowicz, Małgorzata Cieślak

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First published in London, United Kingdom, 2022 by IntechOpen IntechOpen is the global imprint of INTECHOPEN LIMITED, registered in England and Wales, registration number: 11086078, 5 Princes Gate Court, London, SW7 2QJ, United Kingdom Printed in Croatia

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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization Edited by Chandra Shakher Pathak and Samir Kumar p. cm. Print ISBN 978-1-83968-229-2 Online ISBN 978-1-83968-230-8 eBook (PDF) ISBN 978-1-83968-231-5
