*Edited by Chandra Shakher Pathak and Samir Kumar*

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

ISBN 978-1-83968-229-2

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy

for Materials Characterization

Published in London, UK © 2022 IntechOpen © Jian Fan / iStock

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

> *Edited by Chandra Shakher Pathak and Samir Kumar*
