**2.7 Advantages of using PLD**

The advantages of using PLD include:


**Figure 1.** *Schematic working of pulsed laser deposition.*

**49**

**Figure 3.**

**4. Results and discussion**

300 °C, 450 °C and 600 °C [8].

**and deposition temperatures**

*Binary Metal Oxides Thin Films Prepared from Pulsed Laser Deposition*

iii. a precise control over the growth rate is enabled by the usage of laser

iv.the transfer of the composition for most of the ablated materials show better

**Figure 3** shows the schematic of ZnO deposited on Si/glass substrate by pulsed laser deposition. In this work, pulsed laser deposition technique was used for growing high quality stoichiometric ZnO thin films. Laser from the source hits the ZnO target, a plasma plume consisting of molecules and atoms of zinc and oxygen start to deposit on the surface of the substrate. The plasma plume regime is known as the plasma perimeter. Mostly the plume will be centered in the course of the plasma perimeter. The plasma perimeter dependent upon the factors such as laser energy, laser repetition rate, temperature maintained, pressure and the distance between the target and the substrate. A detailed study of the effects of laser repetition rate, deposition and annealing temperatures on the electrical, optical and structural properties of the pulsed laser deposited ZnO thin films were carried out.

In the same way the preparation for other materials such as MoO3, MoO2, binary oxides ZnO/MoO3, ZnO/TiO2 and ZnO/V2O5 were carried out with pulsed laser deposition. Various analytical techniques such as SEM, UV–Visible spectroscopy, current–voltage characterization, ac complex impedance spectroscopy were also carried out to study the structural, morphological, optical and electrical properties.

**4.1 Investigation of ZnO nanostructures with the effects of laser repetition rate** 

*Schematic of pulsed laser deposited ZnO thin film nanostructures/nanotextures on Glass/Si substrate [7].*

The structure and properties of the transparent ZnO films deposited on glass substrates were then analyzed using X-ray Diffraction (XRD) as shown in **Figure 4** and confirmed the presence of hexagonal wurzite ZnO for the samples deposited at

*DOI: http://dx.doi.org/10.5772/intechopen.96161*

congruence and stoichiometry.

beam and

**3. Experimental details**

**Figure 2.** *Operation of PLD instrument (a) before and (b) after deposition.*

