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## Meet the editor

Dr. Muhammad Zubair is an associate professor in the Department of Mechanical and Nuclear Engineering, University of Sharjah, United Arab Emirates. Prior to this role, Dr. Zubair worked as an assistant professor and graduate program coordinator at the University of Engineering and Technology Taxila, Pakistan. Dr. Zubair's interests include nuclear reactor safety, accident analysis, reliability and risk analysis, digital instru-

mentation and control, and radiation detection and measurements. He has a strong research background supported by publications in international journals, conferences, and book chapters. He is engaged in different research projects including one coordinated by the International Atomic Energy Agency (IAEA). He also serves as editor, associate editor, and technical committee member for international journals and conferences.

Contents

**Section 1**

**Section 2**

**Section 3**

**Section 4**

Uncertainty

**Section 5**

Reliability

*and Amadou Ouane*

Water Reactor (PWR)

**Preface XI**

Introduction **1**

**Chapter 1 3**

Reliability for Optimal Systems **9**

**Chapter 2 11**

Reliability and Risk Analysis **35**

**Chapter 3 37**

Maintenance and Uncertainty Analysis **45**

**Chapter 4 47**

Reliability for Digital and Analog Systems **63**

**Chapter 5 65**

Introductory Chapter: An Overview of Reliability and Risk Analysis

The Optimal System for Complex Series-Parallel Systems with Cold Standby Units: A Comparative Analysis Approach

Importance Analysis of Containment Spray System in Pressurized

Optimal Maintenance Policy for Second-Hand Equipments under

Digital On-Chip Calibration of Analog Systems towards Enhanced

*by Michal Sovcik, Lukas Nagy, Viera Stopjakova and Daniel Arbet*

*by Ibrahima dit Bouran Sidibe, Imene Djelloul, Abdou Fane* 

*by Muhammad Zubair and Eslam Ahmed*

*by Ibrahim Yusuf and Ismail Muhammad Musa*

*by Muhammad Zubair and Priyonta Rahman*

### Contents


Preface

This book presents the state of the art in reliability and risks analysis engineering from a product lifecycle standpoint. The book provides comprehensive insights into optimization of systems, digital and analog systems, uncertainty quantification, and maintenance as well as risk analysis. The book is intended for senior undergraduate and postgraduate students in related engineering programs such as mechanical engineering, manufacturing engineering, industrial engineering, and engineering management programs, as well as for researchers and engineers in the reliability and

The book is structured in a way that the optimization methods for components and systems are described first. This is because components are the most basic building blocks of engineering systems. The techniques discussed in this chapter provide a comprehensive overview of some reliability features of series-parallel systems under minor and complete failure. Failure and repair time of all units were assumed to be exponentially distributed. Explanatory expressions for system characteristics such as system availability, mean time to failure (MTTF), and profit function and cost benefits for all configurations have been obtained and validated by performing numerical experiments. The next chapter describes reliability analysis in the nuclear industry. It investigates the Containment Spray System (CSS) by using the fault tree analysis (FTA) technique to obtain results of the top event probabilities, minimal cut sets (MCS), risk decrease factor (RDF), fisk increase factor (RIF), and

The chapter on maintenance and uncertainty addresses a maintenance optimization problem for remanufactured equipment that will be reintroduced into the market as secondhand equipment. It discusses and derives an optimal maintenance policy for such equipment to overcome the uncertainty of reparation action. Moreover, the chapter presents experiments and evaluates different life cycles of technologies according to their obsolescence processes (accidental or progressive vanishing) on the optimal operating condition. The last chapter on reliability for digital and analog systems deals with a digital method of calibration for analog-integrated circuits as a means of extending its lifetime and reliability, which consequently affects the reliability of the analog electronic system. The chapter reveals the implementation of an ultra-low voltage on-chip system of the digitally calibrated variable-gain

The editor and the contributors (authors) would like to thank Ms. Dolores Kuzelj

**Muhammad Zubair**

University of Sharjah,

Sharjah, United Arab Emirates

Department of Mechanical and Nuclear Engineering,

amplifier (VGA), fabricated in CMOS 130 nm technology.

risk fields.

sensitivity analysis.

and the staff at IntechOpen.
