**Author details**

Imtisal Akhtar\*, Malik Abdul Rehman and Yongho Seo Department of Nanotechnology and Advanced Materials Engineering, Sejong University, Seoul, South Korea

\*Address all correspondence to: writetoimtisal@hotmail.com

© 2020 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/ by/3.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

*Measuring the Blind Holes: Three-Dimensional Imaging of through Silicon via Using High… DOI: http://dx.doi.org/10.5772/intechopen.92739*
