Chapters by Dr. Frédéric Christien

• Book Chapter The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science
  by Frédéric Christien, Edouard Ferchaud, Pawel Nowakowski and Marion Allart in the book "X-Ray Spectroscopy" edited by Shatendra K. Sharma, ISBN 978-953-307-967-7, InTech, February 2, 2012