Chapters by Dr. Malek Gassoumi

• Book Chapter Conductance Deep-Level Transient Spectroscopic Study of 4H- SiC MESFET and Traps
  by Malek Gassoumi and Hassen Maaref in the book "Physics and Technology of Silicon Carbide Devices" edited by Yasuto Hijikata, ISBN 978-953-51-0917-4, InTech, October 10, 2012