Chapters by Dr. Jung Ho Je

• Book Chapter Characterization of Defects Evolution in Bulk SiC by Synchrotron X-Ray Imaging
  by T. S. Argunova, M. Yu. Gutkin, J. H. Je, V. G. Kohn and E. N. Mokhov in the book "Physics and Technology of Silicon Carbide Devices" edited by Yasuto Hijikata, ISBN 978-953-51-0917-4, InTech, October 10, 2012
• Book Chapter Micropipe Reactions in Bulk SiC Growth
  by M. Yu. Gutkin, T. S. Argunova, V. G. Kohn, A. G. Sheinerman and J. H. Je in the book "Silicon Carbide - Materials, Processing and Applications in Electronic Devices" edited by Moumita Mukherjee, ISBN 978-953-307-968-4, InTech, October 10, 2011