Chapters by Dr. Ming-Shu Li

• Book Chapter Material Characterization and Failure Analysis for Microelectronics Assembly Processes
  by Chien-Yi Huang, Ming-Shu Li, Shan-Yu Huang, Cheng-I Chang and Min-Hui Huang in the book "Wide Spectra of Quality Control" edited by Isin Akyar, ISBN 978-953-307-683-6, InTech, November 11, 2011