Chapters by Mr. Elad Koren

• Book Chapter Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy
  by Elad Koren, Jonathan E. Allen, Uri Givan, Noel Berkovitch, Eric R. Hemesath, Lincoln J. Lauhon and Yossi Rosenwaks in the book "Nanowires - Implementations and Applications" edited by Abbass Hashim, ISBN 978-953-307-318-7, InTech, July 7, 2011