Chapters by Dr. Seiji Takeda

• Book Chapter In-Situ Analysis of Optoelectronic Properties of Semiconductor Nanostructures and Defects in Transmission Electron Microscopes
  by Yutaka Ohno, Ichiro Yonenega and Seiji Takeda in the book "Optoelectronic Devices and Properties" edited by Oleg Sergiyenko, ISBN 978-953-307-204-3, InTech, April 4, 2011