Chapters by Dr. Hervé Jaouen

• Book Chapter A Pearson Effective Potential for Monte-Carlo Simulation of Quantum Confinement Effects in nMOSFETs
  by Marie-Anne Jaud, Sylvain Barraud, Philippe Dollfus, Jérôme Saint-Martin, Arnaud Bournel and Hervé Jaouen in the book "Applications of Monte Carlo Method in Science and Engineering" edited by Shaul Mordechai, ISBN 978-953-307-691-1, InTech, February 2, 2011