Chapters by Prof. Boualem Djezzar

• Book Chapter Automated MOS Transistor Gamma Degradation Measurements Based on LabVIEW Environment
  by Slimane Oussalah and Boualem Djezzar in the book "Modeling, Programming and Simulations Using LabVIEW™ Software" edited by Riccardo De Asmundis, ISBN 978-953-307-521-1, InTech, January 1, 2011