Chapters by Dr. Yasuto Hijikata

• Book Chapter Investigation of SiC/Oxide Interface Structures by Spectroscopic Ellipsometry
  by Sadafumi Yoshida, Yasuto Hijikata and Hiroyuki Yaguchi in the book "Advanced Silicon Carbide Devices and Processing" edited by Stephen E. Saddow and Francesco La Via, ISBN 978-953-51-2168-8, InTech, September 9, 2015
• Book Chapter Thermal Oxidation Mechanism of Silicon Carbide
  by Yasuto Hijikata, Shuhei Yagi, Hiroyuki Yaguchi and Sadafumi Yoshida in the book "Physics and Technology of Silicon Carbide Devices" edited by Yasuto Hijikata, ISBN 978-953-51-0917-4, InTech, October 10, 2012
• Book Chapter Nondestructive and Contactless Characterization Method for Spatial Mapping of the Thickness and Electrical Properties in Homo-Epitaxially Grown SiC Epilayers Using Infrared Reflectance Spectroscopy
  by Sadafumi Yoshida, Yasuto Hijikata and Hiroyuki Yaguchi in the book "Physics and Technology of Silicon Carbide Devices" edited by Yasuto Hijikata, ISBN 978-953-51-0917-4, InTech, October 10, 2012
• Book Chapter Growth Rate Enhancement of Silicon-Carbide Oxidation in Thin Oxide Regime
  by Yasuto Hijikata, Hiroyuki Yaguchi and Sadafumi Yoshida in the book "Properties and Applications of Silicon Carbide" edited by Rosario Gerhardt, ISBN 978-953-307-201-2, InTech, April 4, 2011